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CO Test Instrument 4680nm Bandpass Filter

CO Test Instrument 4680nm Bandpass Filter

4690nm CO detection infrared bandpass filter BP4690, CO detects infrared bandpass filters, mainly used for CO detection and improves signal-to-noise ratio. 1. the product introduction The high-performance narrow-band infrared filter produced by Kingki Optical has a spectral coverage of 210nm to...

  • Features & Specification

    4690nm CO detection infrared bandpass filter

    BP4690, CO detects infrared bandpass filters, mainly used for CO detection and improves signal-to-noise ratio.

    1. the product introduction

    The high-performance narrow-band infrared filter produced by Kingki Optical has a spectral coverage of 210nm to 5400nm. The product has long life, no drift, high transmittance, deep cutoff, high quality and low price.

    image001.jpg

    (4690nm CO Infrared Bandpass Filter)


    2. CO infrared filter parameter curve: (You can fill in the demand table at the end of the text to tell us that you want the product)

    image003(001).jpg


    3.the application:

    4690nmCO infrared bandpass filter, mainly used for CO detection, improve signal to noise ratio.

    Infrared gas detection filter, flexible configuration of a variety of different gas sensors for different gas detection. It is widely used in petroleum, chemical, coal, metallurgy, paper, fire, municipal, telecommunications, food, textile and other industries.


    4. the company's strength

    Kingki has long been responsible for the research and production of military optical coatings. The chief engineer has more than 40 years of military optical coating experience, and has 33 national authorized patents. Nine optical film systems have won the People's Republic of China Science and Technology Progress Award.

    Kingki has a high-end factory building of 4,000 square meters, 13 sets of advanced coating machines and complete test equipment, with the ability to mass produce high-end optical filters.

    Kingki's wide range of products, excellent performance, quality and cheap, prompt delivery.


    5. Demand table

    band pass filters


    AOI

    central

    FWHT

    Tpek

    block

    OD

    metal

    D

    purpose

    quantity

    delivery

    e.g.1

    785±2nm

    10±2

    ≥80%

    200-1100

    6

    no

    10

    fluorometric

    2


    yours














    金吉奥梦公司实力1.jpg


    This expression is deceptively simple. An increase in the number of layers or a move to an absorbing system immediately increases the complexity to a degree that is completely discouraging.

    It is instructive to prepare an admittance diagram (Figure 4.5) for the sin- gle-layer coating. We recall that admittance loci were discussed in Chapter 2. We consider normal incidence only and use free space units for the admit- tances so that they are numerically equal to the refractive indices. The locus for a single layer is a circle, and in this case, it begins at the point 4.0 on the real axis, corresponding to the admittance of the germanium substrate. The center of the circle is on the real axis and the circle cuts the real axis again at the point 2.22/4.0 = 1.21, corresponding to a quarter-wave optical thick-ness. Note especially that since the two points of intersection with the real axis are defined, we do not need to calculate the position of the center. We can mark a scale of δ1 along the locus. Since d1 = 2p n1d1/l, we can either assume λ constant and replace the scale with one of optical thickness or, provided that we assume that the refractive index remains constant with wavelength, for a given layer optical thickness we can mark the scale in terms of g(= l0/l). These various scales have been added. The scale of g assumes that λ0 is the wavelength for which the layer has an optical thick- ness of one quarter-wave.

    This is a particularly simple admittance locus and it is included principally to illustrate the method. We will make some use of admittance diagrams in this chapter. Normally these will be drawn for one value of wavelength and for one value of optical thickness for each layer.


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